Patent database

The Institute of Physics of the Czech Academy of Sciences offers its portfolio of Czech and international patents. Patent applications are prepared by an institutional Patent Attorney, who acts as a Czech and European representative. A license to use industrial rights is usually granted as non-exclusive, but other forms are possible on the basis of individual negotiations. Licenses are arranged by the Knowledge and Technology Transfer group.

  1. J. Hanuš, A. Richter, P. Rydlo, L. Heller
    Pressure and/or force sensor
  2. O. Churpita, A. Dejneka, V. Zablotskyy, Š. Kubinová, E. Syková
    Atmospheric plasma source, particularly for use in medicinal bioapplications
  3. P. Adámek, M. Čada, Z. Hubička, L. Jastrabík, J. Adámek, J. Stöckel
    A method for measuring the ion distribution function in a low temperature plasma, a measuring system for implementing the method and the probe for measuring system
  4. L. Havlák, V. Jarý, M. Nikl, J. Bárta, P. Boháček
    Inorganic scintillator or phosphor based on KLuS2:Eu
  5. L. Havlák, V. Jarý, M. Nikl, J. Bárta, P. Boháček
    Inorganic scintillator based on KLuS2:Ce
  6. P. Straka, M. Smrž
    Stray modulation unit
  7. P. Straka, M. Smrž
    Dispersoscop
  8. R.Škoda, J. Škarohlíd, I. Kratochvílová, A. Taylor, F. Fendrych
    Surface protection of zirconium nuclear fuel tubes.
  9. M. Kocián, S. Kamba
    Phactor - device for measurements of dielectric loss tan($\delta$)
  10. R. Hříbal, O. Rezek, T. Ižák, E. Ukraintsev, B. Rezek
    System for simultaneous measurement of optical and electrical characteristics of samples of biological materials in solution
  11. B. Rezek, A. Kromka, O. Babčenko, J. Libertínová, J. P. Conde, V. Chu, T. Schmiedinger
    Microfluidic system for electrical measurements
  12. O. Churpita, A. Dejneka, V. Zablotskyy, Š. Kubinová, E. Syková
    Low-temperature plasma source, particularly for deactivation of bacteria
  13. P. Adámek, J. Olejníček, M. Čada, Z. Hubička, Š. Kment
    Solar Cell I-V Curve Measurement System
  14. Z. Hubička, M. Čada, P. Adámek
    Multifunctional substrate holder for plasma depositions of optical thin films
  15. P. Boháč, K. Cvrk, M. Veselský, J. Tomáštík, L. Jastrabík, V. Koula
    Laboratory equipment for adhesion testing of thin films to substrates using acoustic emission record for evaluation
  16. D. Vokoun, M. Beleggia
    Quiet magnetic velcro fastenner
  17. P. Boháč, K. Cvrk, M. Veselský, J. Tomáštík, L. Jastrabík, V. Koula
    A measuring extension on sample holder for diagnostic equipment allowing to scan acoustic emission during scratch test
  18. P. Boháč, M. Veselský, K. Cvrk, J. Tomáštík, R. Čtvrtlík, L. Jastrabík, V. Koula
    The duralumin adapter to sample holder with an integrated sensor of acoustic emission generated by scratch test
  19. P. Boháč, M. Veselský, K. Cvrk, J. Tomáštík, R. Čtvrtlík, L. Jastrabík, V. Koula
    Measuring head for nanotester NT600, which allows the scanning of acoustic emission with increased sensitivity
  20. P. Boháč, M. Dráb, J. Tomáštík, R. Čtvrtlík
    Software utility “envelope”
  21. V. Jirásek, Š. Potocký, A. Sveshnikov
    GENERAL METHODOLOGY FOR HIGH TEMPERATURE PROCESSES OF SEMICONDUCTOR TECHNOLOGY BY THE FINITE ELEMENT METHODS